The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Aug. 21, 2018
Applicant:

Screen Holdings Co., Ltd., Kyoto, JP;

Inventors:

Mitsuhiro Yoshida, Kyoto, JP;

Yuichi Hanada, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 11/00 (2006.01); B65H 23/02 (2006.01); B41J 2/21 (2006.01); B41J 15/04 (2006.01); B41J 15/24 (2006.01);
U.S. Cl.
CPC ...
B41J 11/0095 (2013.01); B41J 2/2146 (2013.01); B41J 11/008 (2013.01); B41J 11/0025 (2013.01); B41J 15/04 (2013.01); B41J 15/24 (2013.01); B65H 23/0216 (2013.01); B65H 2801/12 (2013.01);
Abstract

A base material processing apparatus includes a first edge sensor, a second edge sensor, and a displacement amount calculation part. The first edge sensor acquires a first detection result (R) by detecting the position of an edge of a base material in the width direction at a first detection position. The second edge sensor acquires a second detection result (R) by detecting the position of the edge of the base material in the width direction at a second detection position. The displacement amount calculation part calculates the amount of displacement in the position of the base material in the transport direction on the basis of the first detection result (R) and the second detection result (R). Accordingly, the amount of displacement in the position of the base material in the transport direction can be detected without depending on images such as register marks.


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