The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Oct. 31, 2019
Applicant:

Alltec Angewandte Laserlicht Technologie Gmbh, Selmsdorf, DE;

Inventors:

Faycal Benayad-Cherif, Lexington, MA (US);

Christopher Bahns, Westford, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); B41J 2/47 (2006.01); B41J 2/44 (2006.01);
U.S. Cl.
CPC ...
B41J 2/47 (2013.01); B41J 2/442 (2013.01);
Abstract

A laser marking system includes a laser, an image capture device, a marking head including electromagnetic energy deflectors and a lens, beam paths of the laser of the image capture device both passing through the lens, and a computer system. The computer system is programmed to perform a method including generating an image calibration model at each of multiple areas across a marking field of the laser marking system, adjusting the electromagnetic energy deflectors to direct the beam path of the image capture device to multiple different locations within the marking field of the laser marking system, and capturing image tiles at each of the multiple different locations with the image capture device, wherein at each of the multiple different locations, if a location corresponds to an area at which an image calibration model was generated, correcting the image tile according to the image calibration model generated at the location.


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