The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2020

Filed:

Jun. 24, 2016
Applicants:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Ati Technologies Ulc, Markham, CA;

Inventors:

Stanley Ames Lackey, Jr., Leominster, MA (US);

Damon Tohidi, Richmond Hill, CA;

Gerald R. Talbot, Concord, MA (US);

Edoardo Prete, Arlington, MA (US);

Assignees:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

ATI Technologies ULC, Markham, CA;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04L 12/26 (2006.01); H04L 7/10 (2006.01); H04L 25/14 (2006.01); H04L 7/06 (2006.01); H04L 7/00 (2006.01); H04L 7/04 (2006.01);
U.S. Cl.
CPC ...
H04L 41/147 (2013.01); H04L 7/06 (2013.01); H04L 7/10 (2013.01); H04L 25/14 (2013.01); H04L 43/0823 (2013.01); H04L 43/0852 (2013.01); H04L 43/50 (2013.01); H04L 7/0041 (2013.01); H04L 7/043 (2013.01);
Abstract

Systems, apparatuses, and methods for utilizing training sequences on a replica lane are described. A transmitter is coupled to a receiver via a communication channel with a plurality of lanes. One of the lanes is a replica lane used for tracking the drift in the optimal sampling point due to temperature variations, power supply variations, or other factors. While data is sent on the data lanes, test patterns are sent on the replica lane to determine if the optimal sampling point for the replica lane has drifted since a previous test. If the optimal sampling point has drifted for the replica lane, adjustments are made to the sampling point of the replica lane and to the sampling points of the data lanes.


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