The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2020

Filed:

Aug. 19, 2019
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Andrew Arnett, San Diego, CA (US);

Dai Lu, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H01Q 3/26 (2006.01); H04B 17/21 (2015.01); H04B 17/11 (2015.01); H04B 1/40 (2015.01);
U.S. Cl.
CPC ...
H01Q 3/2605 (2013.01); H04B 1/40 (2013.01); H04B 17/11 (2015.01); H04B 17/21 (2015.01);
Abstract

Methods, systems, and devices are described for calibration of an array antenna system. A device may transmit a calibration signal from a first antenna element of an antenna array. The calibration signal may be generated by modulating a first signal having a first frequency with a modulation signal having a second frequency. The device may receive the calibration signal using a second antenna element of the antenna array. The device may analyze a sideband of the received calibration signal, where the sideband may be offset in frequency from the first frequency by the second frequency. The device may calibrate the array antenna system based on or more measured properties of the sideband.


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