The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
Oct. 16, 2018
The Trustees of Columbia University IN the City of New York, New York, NY (US);
Alan Chad DeChant, New York, NY (US);
Hod Lipson, New York, NY (US);
Rebecca J. Nelson, New York, NY (US);
Michael A. Gore, New York, NY (US);
Tyr Wiesner-Hanks, New York, NY (US);
Ethan Stewart, New York, NY (US);
Jason Yosinski, New York, NY (US);
Siyuan Chen, New York, NY (US);
The Trustees of Columbia University in the City of New York, New York, NY (US);
Cornell University, Ithaca, NY (US);
Abstract
Disclosed are devices, systems, apparatus, methods, products, and other implementations, including a method to detect pattern characteristics in target specimens that includes acquiring sensor data for the target specimens, dividing the acquired sensor data into a plurality of data segments, and generating, by multiple neural networks that each receives the plurality of data segments, multiple respective output matrices, with each data element of the multiple respective output matrices being representative of a probability that corresponding sensor data of a respective one of the plurality of data segments includes a pattern characteristic in the target specimens. The method further includes determining by another neural network, based on the multiple respective output matrices generated by the multiple neural networks, a presence of the pattern characteristic in the target specimens.