The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2020

Filed:

Dec. 04, 2012
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Venkat K. Chandra, Andover, MA (US);

Prasad G. Parulekar, Wayland, MA (US);

Sunil Sarin, Newton, MA (US);

Krishnan Seetharaman, Shrewsbury, MA (US);

David L. Shepard, Sterling, MA (US);

Lawrence Stabile, Cambridge, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/27 (2019.01);
U.S. Cl.
CPC ...
G06F 16/27 (2019.01);
Abstract

The present invention provides a method, system and computer program product for replication control using eventually consistent meta-data. In an embodiment of the invention, a method for replication control using eventually consistent meta-data is provided. The method includes replicating data in a replication data processing system of nodes coupled to one another over a computer communications network. The method also includes replicating meta-data representing the state of the replication data processing system into a data structure of eventually consistent meta-data. Finally, the method includes managing the replication of the data according to the replicated meta-data.


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