The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10747651 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 18, 2020

Filed:

May. 31, 2018
Applicant:

The Ultimate Software Group, Inc., Weston, FL (US);

Inventors:

Robert L. Vanderwall, Weston, FL (US);

John A. Maliani, Pembroke Pines, FL (US);

Michael L. Mattera, Coral Springs, FL (US);

Dionny Santiago, Weston, FL (US);

Brian R. Muras, Weston, FL (US);

Keith A. Briggs, Coral Springs, FL (US);

David Adamo, Sunrise, FL (US);

Tariq King, Pembroke Pines, FL (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3688 (2013.01); G06F 11/3692 (2013.01);
Abstract

A system for optimizing system resources and runtime during a testing procedure is disclosed. During operation, the system may perform hypothesis testing on an application under evaluation, such as performing hypothesis testing on suggested constraints for the application under evaluation, which may result in the creation of new hypotheses yielding improved confidences. This testing may be optimized by simplifying and/or reducing the number of hypothesis tests used during the testing process. To do so, the hypothesis tests may be sorted into sets, and a subset of these sorted hypothesis tests may be executed. Based on the results of this testing, a remaining portion of the hypothesis tests may be skipped, allowing for an optimization of the testing process without reducing the quality of the testing procedure.


Find Patent Forward Citations

Loading…