The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
Mar. 21, 2018
Applicant:
Didi Research America, Llc, Mountain View, CA (US);
Inventors:
Dong Li, Santa Clara, CA (US);
Huaiyu Zhu, Newark, CA (US);
Jing Chen, Palo Alto, CA (US);
Michael Lin, Milpitas, CA (US);
Shray Kapoor, Fremont, CA (US);
Yichong Lin, Saratoga, CA (US);
Assignee:
DiDi Research America, LLC, Mountain View, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/06 (2006.01); G06F 9/54 (2006.01); G06F 12/02 (2006.01); G06F 16/901 (2019.01); G06F 16/951 (2019.01);
U.S. Cl.
CPC ...
G06F 9/542 (2013.01); G06F 9/544 (2013.01); G06F 9/545 (2013.01); G06F 9/546 (2013.01); G06F 12/0253 (2013.01); G06F 16/9024 (2019.01); G06F 16/951 (2019.01); G06F 9/54 (2013.01); G06F 2209/548 (2013.01);
Abstract
Process states of computing devices may be collected for processing. Process event information of a first computing device may be determined based on an observation of process creation events and process termination events, a garbage collection, and a process scan. The process event information may be provided to a second computing device.