The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2020

Filed:

Nov. 10, 2016
Applicant:

Omron Corporation, Kyoto, JP;

Inventor:

Minoru Oka, Moriyama, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); H05K 13/08 (2006.01); G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G05B 19/41875 (2013.01); G05B 19/418 (2013.01); G06Q 10/0637 (2013.01); H05K 13/083 (2018.08); G05B 2219/32187 (2013.01); G05B 2219/32194 (2013.01); G05B 2219/32214 (2013.01); G05B 2219/32221 (2013.01); Y02P 90/18 (2015.11); Y02P 90/22 (2015.11); Y02P 90/28 (2015.11);
Abstract

Provided is a management system for performing quality management on production equipment. A management system that includes: an acquisition component that acquires status information for production equipment that is subject to management; a detection component that, on the basis of the acquired status information, detects the occurrence of some event; and a display component that displays, separated according to inclusion in the four perspectives Machine, Man, Material, and Method, a plurality of factors that could be presumed to have caused the detected event in a manner in which the contents thereof and a probability of having caused the event can be compared.


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