The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
Feb. 26, 2019
Fanuc Corporation, Yamanashi, JP;
Kazuhiro Satou, Yamanashi, JP;
Yoshitaka Kubo, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
An abnormality factor identification apparatus includes a sensor signal obtaining unit that obtains sensor signals associated with the physical state of a machine, an operating state determination unit that determines operating states of the machine based on information obtained from the machine, an abnormality level calculation unit that calculates the abnormality levels of the sensor signals for each operating state of the machine determined by the operating state determination unit, and a factor identification unit that determines a factor in an abnormality in the machine from historical data being a series of the abnormality levels for each operating state.