The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
Mar. 15, 2016
Nec Corporation, Tokyo, JP;
Shinichiro Yoshida, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An abnormality of a system is caused by a failure or aged deterioration is determined. A monitoring apparatus includes a model storage unit, a model generation unit, and a determination unit. The model storage unit stores a monitoring model that is a model for one point in time. The model indicates a relationship among a plurality of metrics of a system. The model generation unit generates a comparison model that is the model for a point in time at which the relationship among the plurality of metrics does not conform to the monitoring model. The determination unit determines that the relationship among metrics in the system has changed in a case where the comparison model indicates the relationship among metrics among which the monitoring model indicates the relationship, and outputs a result of the determination.