The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2020

Filed:

Nov. 06, 2015
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Kevin Bernard Kenny, Niskayuna, NY (US);

Alex David Corwin, Niskayuna, NY (US);

David Andrew Shoudy, Niskayuna, NY (US);

Christine Lynne Surrette, Niskayuna, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); H04N 17/00 (2006.01); H04N 5/262 (2006.01); H04N 5/235 (2006.01); H04N 5/217 (2011.01); G01N 21/27 (2006.01); G01J 1/02 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G01J 1/0228 (2013.01); G01N 21/274 (2013.01); G01N 21/6458 (2013.01); H04N 5/2173 (2013.01); H04N 5/2351 (2013.01); H04N 5/2628 (2013.01); H04N 17/002 (2013.01);
Abstract

Approaches are disclosed for calibrating a plurality of imaging devices, such as microscopes. In certain implementations, a calibration plate is employed that includes a variety of calibration features. The calibration features comprise a geometric calibration, an illumination calibration, and an optical calibration. Imaging devices calibrated in accordance with the present approaches may be used to generate images having consistent attributes, such as brightness, regardless of which imaging device is employed.


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