The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
Jun. 18, 2018
Applicant:
Korea Aerospace Research Institute, Daejeon, KR;
Inventor:
Jae Min Shin, Daejeon, KR;
Assignee:
KOREA AEROSPACE RESEARCH INSTITUTE, Daejeon, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01); G01S 7/40 (2006.01);
U.S. Cl.
CPC ...
G01S 13/9005 (2013.01); G01S 7/4026 (2013.01); G01S 13/90 (2013.01); G01S 13/904 (2019.05); G01S 13/9011 (2013.01); G01S 13/9017 (2013.01); G01S 13/9064 (2019.05); G01S 2007/4034 (2013.01);
Abstract
Disclosed is a calibration method of performing dual radiometric compensation by using an antenna gain pattern of a synthetic aperture radar (SAR) both in a time domain and in a frequency domain. The method may include performing frequency-domain radiometric compensation in relation to an elevation angle and performing time-domain radiometric compensation in relation to a frequency to calibrate the antenna gain pattern.
Quick Actions:
Shin, Jae. (2020). Method and apparatus for compensating antenna gain pattern (U.S. Patent No. 10746869). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10746869
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