The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
Jun. 22, 2016
The Medical College of Wisconsin, Inc., Milwaukee, WI (US);
Kevin Koch, Wauwatosa, WI (US);
Casey Anderson, Milwaukee, WI (US);
The Medical College of Wisconsin, Inc., Milwaukee, WI (US);
Abstract
Systems and methods for quantitative susceptibility mapping ('QSM') using magnetic resonance imaging ('MRf') and a localized processing technique are described. A field-shift map is processed based on localized regions of local field perturbations. These localized field-shift regions are processed using established QSM algorithms, or using direct dipole inversion techniques, to compute regional susceptibility distributions from the localized field shift information. When the localized regions correspond to subvolumes of the field-shift map, local susceptibility maps can be generated and combined to form a composite quantitative susceptibility map. By computing regional susceptibility distributions based on localized field-shift information, residual streaking artifacts in the susceptibility map are constrained to the individual volumes from which they originate, thereby eliminating their propagation through the image.