The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
May. 26, 2017
Applicant:
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Inventors:
Assignee:
Rhode & Schwarz GmbH & Co. KG, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01R 33/028 (2006.01); G01R 29/08 (2006.01); G01R 31/302 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); G01R 33/028 (2013.01); G01R 29/0878 (2013.01); G01R 31/3025 (2013.01);
Abstract
A test system for measuring beam characteristics of a device under test (DUT) is provided. The system comprises a DUT, a measurement antenna configured to receive electro-magnetic radiation emitted by the DUT, a link antenna configured to provide a test communication link to the DUT, and a control and analyzing unit configured to control a beam steering of the device under test and to analyze signals from the device under test received by the measurement antenna. The test communication data transmitted to the device under test comprises beam steering control data in order to control the beam steering of the DUT.