The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2020

Filed:

Apr. 24, 2019
Applicant:

Hirotomo Shibaguchi, Fukuoka-shi, Fukuoka, JP;

Inventors:

Hirotomo Shibaguchi, Fukuoka, JP;

Yuki Yasutaka, Fukuoka, JP;

Kojiro Futagami, Fukuoka, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/483 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
G01N 33/4833 (2013.01); G01N 33/5029 (2013.01); G01N 33/5091 (2013.01); G01N 2800/24 (2013.01);
Abstract

The present invention provides a method for testing an allergy capable of rapidly and highly accurately testing an allergic reaction. The method can determine whether or not a patient has an allergy or whether or not an agent that may be allergenic to a patient has an allergenicity (an allergic reactivity) in the patient. The method may comprise the steps of causing migration of leukocytes separated from a healthy human or cells of an established cell line with a chemotactic factor contained in a sample such as body fluid or blood of the patient to be tested or a sample stimulated with the agent that may be allergenic to the patient and analyzing the cell kinetics such as migration velocity, migration distance, and migration direction.


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