The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2020

Filed:

Jun. 29, 2017
Applicant:

Framatome, Courbevoie, FR;

Inventor:

Yannick Caulier, Manosque, FR;

Assignee:

FRAMATOME, Courbevoie, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/72 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01N 25/72 (2013.01); G06T 7/0004 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30136 (2013.01);
Abstract

A method for inspecting a metal surface () includes providing a first laser source () that is arranged to generate a first laser beam having a first wavelength comprised between 1000 nm and 1100 nm and a power higher than 1 W; providing a second laser source () that is arranged to generate a second laser beam having a second wavelength comprised between 1500 nm and 1800 nm and a power higher than 1 W; activating one of the first and second laser sources and transmitting the first or second laser beam to the entrance () of an optic (); scanning the metal surface () with the laser beam projected by the optic; and acquiring at least one image of the infrared radiation emitted by the metal surface ().


Find Patent Forward Citations

Caulier, Yannick. (2020). Method for inspecting a metal surface and associated device (U.S. Patent No. 10746679). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10746679

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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