The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2020

Filed:

Dec. 05, 2017
Applicant:

Spectrasensors, Inc., Rancho Cucamonga, CA (US);

Inventors:

Xiang Liu, Phoenix, AZ (US);

Alfred Feitisch, Los Gatos, CA (US);

Xin Zhou, Beijing, CN;

Assignee:

SpectraSensors, Inc., Rancho Cucamonga, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/433 (2006.01); G01J 3/02 (2006.01); G01J 3/42 (2006.01); G01N 21/3504 (2014.01); G01N 21/39 (2006.01); G01N 21/03 (2006.01); G01N 21/27 (2006.01); G01N 21/05 (2006.01);
U.S. Cl.
CPC ...
G01N 21/39 (2013.01); G01J 3/02 (2013.01); G01J 3/42 (2013.01); G01J 3/4338 (2013.01); G01J 3/433 (2013.01); G01J 2003/4332 (2013.01); G01J 2003/4334 (2013.01); G01N 21/031 (2013.01); G01N 21/05 (2013.01); G01N 21/274 (2013.01); G01N 21/3504 (2013.01); G01N 2021/354 (2013.01); G01N 2021/399 (2013.01);
Abstract

Detector data representative of an intensity of light that impinges on a detector after being emitted from a light source and passing through a gas over a path length can be analyzed using a first analysis method to obtain a first calculation of an analyte concentration in the volume of gas and a second analysis method to obtain a second calculation of the analyte concentration. The second calculation can be promoted as the analyte concentration upon determining that the analyte concentration is out of a first target range for the first analysis method.


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