The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
May. 24, 2017
Konica Minolta, Inc., Chiyoda-ku, JP;
Toshio Kawano, Sakai, JP;
Takashi Kawasaki, Sakai, JP;
Konica Minolta, Inc., Tokyo, JP;
Abstract
The reflection characteristic measuring device according to the present invention is a device that includes a diffuse reflecting surface and measures a plurality of mutually different types of reflection characteristics by using a plurality of optical systems having mutually different geometries, which corrects the reflection characteristics to be measured by an error generated when light emitted from an object of measurement is reflected from the diffuse reflecting surface and illuminates the object of measurement. The reflection characteristic measuring device according to the present invention is therefore capable of reducing errors resulting from recursive diffused illumination.