The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
Dec. 19, 2018
The Regents of the University of California, Oakland, CA (US);
Bahram Jalali, Los Angeles, CA (US);
Cejo Lonappan, Los Angeles, CA (US);
Asad Madni, Los Angeles, CA (US);
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Abstract
Apparatus and/or method for performing single-shot network analysis of electrical, electronic and electro-optical elements (e.g., components, circuits, modules, sub-systems and/or systems) on a device, or devices, under test (DUT). A pulsed optical source is directed through a first dispersion element to an modulator, while a delayed version of the pulsed optical source is directed to the DUT (pulsed optical source converted to electrical signal if DUT has electrical input), whose electrical output is fed to the modulator whose modulated optical pulse output is stretched through a second optical dispersion element, then converted to an electrical signal and processed to provide analysis and/or display of DUT response.