The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
Dec. 22, 2017
Applicant:
Infineon Technologies Ag, Neubiberg, DE;
Inventors:
Avik Santra, Munich, DE;
Jagjit Singh Bal, Fremont, CA (US);
Assignee:
INFINEON TECHNOLOGIES AG, Neubiberg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 5/00 (2006.01); G01S 13/88 (2006.01); G01S 7/41 (2006.01); G01S 13/89 (2006.01); G01S 13/90 (2006.01);
U.S. Cl.
CPC ...
G01M 5/0091 (2013.01); G01S 7/411 (2013.01); G01S 13/88 (2013.01); G01S 13/89 (2013.01); G01S 13/9023 (2013.01);
Abstract
In accordance with an embodiment, a method of monitoring a structural object includes performing a first set of radar measurements using a first millimeter-wave radar sensor to produce a first set of radar data, extracting a first interferometric phase from the first set of radar measurements, and determining a structural integrity of the structural object based on the extracted first interferometric phase.