The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2020

Filed:

Apr. 28, 2017
Applicant:

Kawasaki Jukogyo Kabushiki Kaisha, Kobe-shi, Hyogo, JP;

Inventors:

Yukio Iwasaki, Kobe, JP;

Satoru Hibino, Kobe, JP;

Kazunori Hirata, Yao, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); H05K 13/08 (2006.01); G01N 21/95 (2006.01); G01N 21/952 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01N 21/95 (2013.01); G01N 21/952 (2013.01); H05K 13/0812 (2018.08); H05K 13/0813 (2018.08);
Abstract

A component inspecting device inspects presence or absence of an abnormal state of two linear wires based on changes in the amount of received light of a first light ray and a second light ray received by a first light receiver and a second light receiver, respectively when a component is moved such that the two linear wires in the normal state block the first light ray and the second light ray in a posture wherein an arrangement direction of the two linear wires crosses optical axes of the first light ray of the first light projector and the second light ray of the second light projector. This device can detect an abnormality such as a bend or the like of linear wires by a simple configuration and a simple operation in a component having two linear wires which have axis directions parallel to each other and have different lengths.


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