The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2020

Filed:

Oct. 24, 2016
Applicant:

University of Florida Research Foundation, Inc., Gainesville, FL (US);

Inventors:

Cheng Xu, Chandler, AZ (US);

Kirk Jeremy Ziegler, Gainesville, FL (US);

Jie Liu, Greer, SC (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C25D 1/00 (2006.01); C25D 1/04 (2006.01); C25D 11/04 (2006.01);
U.S. Cl.
CPC ...
C25D 1/006 (2013.01); C25D 1/04 (2013.01); C25D 11/045 (2013.01);
Abstract

Various examples are provided for vertically aligned ultra-high density nanowires and their transfer onto flexible substrates. In one example, a method includes forming a plurality of vertically aligned nanowires inside channels of an anodized alumina (AAO) template on an aluminum substrate, where individual nanowires of the plurality of vertically aligned nanowires extend to a distal end from a proximal end adjacent to the aluminum substrate; removing the aluminum substrate and a portion of the AAO template to expose a surface of the AAO template and a portion of the proximal end of the individual nanowires; depositing an interlayer on the exposed surface of the AAO template and the exposed portion of the individual nanowires; and removing the AAO template from around the plurality of vertically aligned nanowires embedded in the interlayer.


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