The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
Sep. 20, 2017
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Naoko Yoshida, Kanagawa, JP;
Yoshitaka Yamaguchi, Kanagawa, JP;
Hideyasu Ishibashi, Kanagawa, JP;
Eriko Ikeda, Kanagawa, JP;
Takeharu Tani, Kanagawa, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/107 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0077 (2013.01); A61B 5/107 (2013.01); A61B 5/1079 (2013.01); A61B 5/442 (2013.01); A61B 5/443 (2013.01); A61B 5/742 (2013.01); A61B 2576/02 (2013.01);
Abstract
A skin evaluation apparatus includes a shape information acquisition unitthat acquires information on a surface unevenness shape of the skin; an optical feature information acquisition unitthat acquires information on an optical feature of the skin; and an evaluation unitthat evaluates gloss of the skin on the basis of the information on the surface unevenness shape and the information on the optical feature.