The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
Jul. 25, 2017
Centre National DE LA Recherche Scientifique, Paris, FR;
Egidijus Auksorius, Paris, FR;
Albert Claude Boccara, Paris, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Paris, FR;
Abstract
A system for the full-field interferential imaging of a sample, includes an illumination path with a light source, an interferometer with at least one first objective, and a separating element for receiving incident light waves via an input face and for forming an object arm for receiving the sample and a reference arm on which a reflection device is arranged, the reflection device being used to reflect incident light waves in a direction different from the direction of incidence. The separator element has a reflection coefficient and a transmission coefficient that are non-equal such that the proportion of the optical power of the incident light waves sent to the object arm is strictly larger than the proportion of the optical power of the light waves sent to the reference arm. The system also comprises a detection path comprising a two-dimensional image acquisition device, the illumination path and the detection path comprising a common path comprising\input face of the separator element and being separated by a reflection element.