The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Sep. 02, 2016
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Te-Mei Wang, Hsinchu, TW;

Zen-Chung Shih, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 13/246 (2018.01); H04N 5/222 (2006.01); G01B 11/25 (2006.01); H04N 13/239 (2018.01);
U.S. Cl.
CPC ...
H04N 13/246 (2018.05); G01B 11/2504 (2013.01); G01B 11/2513 (2013.01); H04N 5/2226 (2013.01); H04N 13/239 (2018.05); H04N 17/002 (2013.01);
Abstract

A depth sensing apparatus with self-calibration and a self-calibration method thereof are provided. The depth sensing apparatus includes a projection apparatus, an image capturing apparatus and a calibration module. The projection apparatus projects a calibration pattern and a depth computation pattern to a reference plane based on a predefined calibration pattern and a predefined depth computation pattern. The image capturing apparatus captures an image including the calibration pattern and the depth computation pattern. The calibration module coupled to the image capturing apparatus adjusts apparatus parameters of the depth sensing apparatus to calibrate a depth computation deviation according to the calibration pattern of the image, the predefined calibration pattern and a predefined lookup table corresponding to the predefined calibration pattern.


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