The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Apr. 03, 2017
Applicant:

Level 3 Communications, Llc, Broomfield, CO (US);

Inventor:

Sergey Yermakov, Littleton, CO (US);

Assignee:

Level 3 Communication, LLC, Broomfield, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 12/14 (2006.01); G06F 12/16 (2006.01); G08B 23/00 (2006.01); H04L 29/06 (2006.01); H04L 12/26 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); H04L 43/02 (2013.01); H04L 43/04 (2013.01); H04L 43/0817 (2013.01); H04L 41/0213 (2013.01); H04L 63/1458 (2013.01);
Abstract

In an embodiment, a computer-implemented method compares metrics from different data flows to detect flaws in collection of data describing operation of a network. The method uses a first network data collection technique to collect a first metric describing a characteristic of a network interface. Using a second network data collection technique different from the first network data collection technique, a second metric describing the characteristic of the network interface is collected. The first metric is compared with the second metric to determine whether the first and second metrics are incongruous. When the first and second metrics are determined to be incongruous, a flaw is detected to exist in the first or second network data collection techniques.


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