The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Oct. 20, 2015
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Robert R. Friedlander, Southbury, CT (US);
James R. Kraemer, Santa Fe, NM (US);
Jeb Linton, Manassas, VA (US);
Christopher M. Poulin, Littleton, MA (US);
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/00 (2006.01); G06F 21/00 (2013.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1416 (2013.01); H04L 63/1441 (2013.01);
Abstract
Methods and systems for event detection include defining a plurality of conditions that represent one or more synthetic events. Data from a plurality of data sources is aggregated across a period of time, multiple attack surfaces, and geographically distinct locations. The aggregated data is matched to the conditions to determine whether a synthetic event has occurred. A response to the synthetic event is formed to resist an attack.