The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10742534 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 11, 2020

Filed:

May. 25, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Aly Megahed, San Jose, CA (US);

Mohamed Mohamed, San Jose, CA (US);

Samir Tata, Cupertino, CA (US);

Alaa Elwany, College Station, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/26 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 43/103 (2013.01); H04L 41/06 (2013.01); H04L 41/147 (2013.01); H04L 43/08 (2013.01);
Abstract

A monitoring system for metric data may include devices, each device capable of generating respective metric data. The monitoring system may also include a processor and a memory cooperating therewith. The processor may be configured to monitor the devices via a network to obtain the respective metric data, generate predicted trigger events based on monitoring the devices, and generate a respective adapted monitoring for the devices based upon each predicted trigger event. The processor may also be configured to, upon occurrence of one of the predicted trigger events, implement the respective adapted monitoring to obtain new respective metric data.


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