The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Jun. 29, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Brian O'Connell, Wake, NC (US);

Shyam Manohar, Karnataka, IN;

Richard A. Locke, Cary, NC (US);

Aaron K. Baughman, Silver Spring, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 12/24 (2006.01); G06F 9/455 (2018.01);
U.S. Cl.
CPC ...
H04L 41/145 (2013.01); G06F 9/45558 (2013.01); H04L 41/147 (2013.01); H04L 43/50 (2013.01);
Abstract

A future event that is likely to occur in a production SDI at a future time is forecasted by analyzing operational data from the production SDI. Using a repository of correlation records, a set of configurations is forecasted likely to change in response to the future event. Corresponding to a configuration from the forecasted set of configurations, an instruction is constructed for a testing SDI. The testing SDI is caused by the instruction to initialize a test VM in the testing SDI, where the test VM is specifically configured to test a change in the configuration from the forecasted set of configurations, and where the test VM is ready to test the change when the future event occurs at the future time.


Find Patent Forward Citations

O'Connell, Brian. (2020). Rapid testing of configuration changes in software defined infrastructure (U.S. Patent No. 10742517). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10742517

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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