The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Jun. 20, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Michael A. Guillorn, Cold Springs, NY (US);

Nicolas Loubet, Guilderland, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 21/84 (2006.01); H01L 21/02 (2006.01); H01L 21/3065 (2006.01); H01L 21/308 (2006.01); H01L 21/324 (2006.01); H01L 29/66 (2006.01); H01L 21/3105 (2006.01); H01L 21/8238 (2006.01); H01L 27/092 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0673 (2013.01); H01L 21/0228 (2013.01); H01L 21/02532 (2013.01); H01L 21/308 (2013.01); H01L 21/3065 (2013.01); H01L 21/31058 (2013.01); H01L 21/324 (2013.01); H01L 21/84 (2013.01); H01L 29/0649 (2013.01); H01L 29/66795 (2013.01); H01L 21/823807 (2013.01); H01L 21/823878 (2013.01); H01L 27/0924 (2013.01);
Abstract

Method for forming dielectric isolation region and SiGe channels for CMOS integration of nanosheet devices generally includes epitaxially growing a multilayer structure including alternating layers of silicon, silicon germanium having a germanium content of x atomic percent and silicon germanium having a germanium content of at least 25 atomic percent greater than x. The alternating layers can be arranged and selectively patterned to form a nitride dielectric isolation region, silicon nanochannels in the NFET region, and silicon germanium nanochannels in the PFET region.


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