The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Apr. 29, 2016
Micromass Uk Limited, Wilmslow, GB;
Leco Corporation, St. Joseph, MI (US);
John Brian Hoyes, Stockport, GB;
Keith Richardson, High Peak, GB;
Anatoly Verenchikov, Wilmslow, GB;
Mikhail Yavor, St Petersburg, RU;
MICROMASS UK LIMITED, Wilmslow, GB;
Abstract
A method of time-of-flight mass spectrometry is disclosed comprising: providing two ion mirrors () that are spaced apart in a first dimension (X-dimension) and that are each elongated in a second dimension (Z-dimension) orthogonal to the first dimension; introducing packets of ions () into the space between the mirrors using an ion introduction mechanism () such that the ions repeatedly oscillate in the first dimension (X-dimension) between the mirrors () as they drift through said space in the second dimension (Z-dimension); oscillating the ions in a third dimension (Y-dimension) orthogonal to both the first and second dimensions as the ions drift through said space in the second dimension (Z-dimension); and receiving the ions in or on an ion receiving mechanism () after the ions have oscillated multiple times in the first dimension (X-dimension); wherein at least part of the ion introduction mechanism () and/or at least part of the ion receiving mechanism () is arranged between the mirrors ().