The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Feb. 28, 2018
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Atsuhiko Toyama, Kyoto, JP;
Hideki Yamamoto, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;
Abstract
As soon as a set of data is acquired by a mass spectrometric analysis, an accumulated value of the signal intensity on the mass spectrum is calculated for each m/z segment obtained by dividing the entire m/z range covered by the measurement by a predetermined m/z width. Only the m/z segments with accumulated signal-intensity values equal to or greater than a predetermined threshold are selected as the target for an MS/MS analysis. MS/MS analysis is performed for each selected m/z segment, using ions whose m/z values fall within the m/z segment as precursor ions. A measurement cycle which includes mass spectrometric analysis performed one time and MS/MS analysis performed one or more times is repeated. After that, ions originating from the same component are selected based on the retention time of a peak in an extracted ion chromatogram created for each product ion, and the component is identified.