The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Dec. 15, 2017
Applicants:

The University of British Columbia, Vancouver, CA;

The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);

Inventors:

Alireza Nojeh, Vancouver, CA;

Mike H. C. Chang, Vancouver, CA;

Kais Dridi, Vancouver, CA;

George Albert Sawatzky, Surrey, CA;

Reuben Levi Paul, Vancouver, CA;

R. Fabian W. Pease, Stanford, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 29/48 (2006.01); H01J 33/04 (2006.01); H01J 35/14 (2006.01); H01J 37/075 (2006.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
H01J 29/48 (2013.01); H01J 33/04 (2013.01); H01J 35/14 (2013.01); H01J 37/075 (2013.01); H01J 37/28 (2013.01);
Abstract

An electron beam source is provided that includes a vessel forming a chamber, a cathode disposed within the chamber, the cathode comprising a low dimensional electrically conductive material having an anisotropic restricted thermal conductivity, an electrode disposed in the chamber, the electrode being connectable to a power source for applying a positive voltage to the electrode relative to the cathode for accelerating free electrons away from the cathode to form an electron beam when the cathode is illuminated by electromagnetic (EM) radiation such that the cathode thermionically emits free electrons, and an electron emission window in the chamber for passing a generated electron beam out of the chamber. An electron microscope that incorporates the electron beam source is also provided.


Find Patent Forward Citations

Loading…