The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Nov. 15, 2016
Koninklijke Philips N.v., Eindhoven, NL;
Dmitry Nikolayevich Znamenskiy, Eindhoven, NL;
Ruud Vlutters, Eindhoven, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
A method for estimating the absolute size dimensions of a test object based on image data of the test object, namely a face or part of a person. The method includes receiving image data of the test object, determining a first model of the test object based on the received image data, and aligning and scaling the first model to a first average model that includes an average of a plurality of first models of reference objects being faces or parts of faces of reference persons. The first models of the reference objects are of a same type as the first model of the test object. The method further includes determining a shape difference between the test object and an average of the reference objects, determining a second model of the test object with an estimated scale based on (i) the determined shape difference, (ii) a statistical operator that is indicative of a statistical correlation between shape and size dimensions of the reference objects, and (iii) a second average model, and determining the size dimensions of the test object based on the second model of the test object.