The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Sep. 05, 2018
Applicant:
Vibe Imaging Analytics Ltd., Bnei-Brak, IL;
Inventors:
Ron Hadar, Capitola, CA (US);
Vera Israeli, Petah Tikva, IL;
Assignee:
VIBE IMAGING ANALYTICS LTD., Bnei-Brak, IL;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/90 (2017.01); H04N 5/33 (2006.01); A01D 41/127 (2006.01); H04N 5/247 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); A01D 41/1277 (2013.01); G06T 7/90 (2017.01); H04N 5/2258 (2013.01); H04N 5/247 (2013.01); H04N 5/33 (2013.01); H04N 5/332 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/20072 (2013.01);
Abstract
A system and method for automated grain inspection and analysis of results, that inspects grains using a plurality of light spectra, analyzes the results, and produces detailed reports from the analysis.