The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Jun. 22, 2018
Fujifilm Corporation, Tokyo, JP;
Shunichiro Nonaka, Tokyo, JP;
Masashi Kuranoshita, Yokohama, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
A measurement support apparatus includes an image acquisition unit; a scale image generation unit, the scale image representing a scale assigned at least one of gradations for measuring a length of the crack or line drawings and numerals for measuring a width of the crack; and an image display unit that displays the image of the structure and the scale image in a superimposed manner in a display area, in which the scale image generation unit generates a scale image in accordance with a distance between the image acquisition unit and the measurement surface and an orientation of the measurement surface, and the image display unit displays the generated scale image in the superimposed manner at a position according to a position of the crack in the image of the structure in a direction according to a direction of the crack in the image of the structure.