The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
May. 08, 2018
Huizhou China Star Optoelectronics Technology Co., Ltd., Huizhou Guangdong, CN;
Yanxue Wang, Huizhou Guangdong, CN;
HUIZHOU CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD., Huizhou, CN;
Abstract
The present invention provides a method for detection of in-panel mura based on Hough transform and Gaussian function fitting, including: S1. acquiring an original gray-scale image; S2. acquiring a binarized image according to the gray-scale image; S3. performing an edge detection via Hough transform to crop edges of the gray-scale image; and S4. performing histogram statistics on the cropped gray-scale image, fitting the histogram to a Gaussian function, and detecting an in-panel mura result according to the fitting parameters. The present invention is able to determine images of the display region via Hough transform in order to acquire the region for in-panel mura detection, and also evaluate severity of in-panel mura via parameters acquired by Gaussian function fitting, and thus to quickly detecting in-panel mura.