The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Aug. 07, 2019
Applicant:

Vis Machina, Inc., Albany, CA (US);

Inventors:

Alex Harvill, Berkeley, CA (US);

Michael Fu, Albany, CA (US);

Assignee:

Vis Machina Inc., Albany, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/04 (2013.01);
Abstract

A computer-implemented method of performing machine vision prediction of digital images using synthetically generated training assets comprises digitally capturing a plurality of assets; configuring each of the assets in the plurality of assets with a plurality of asset attributes; under computer program control, selecting a plurality of different combinations of parameters from among the plurality of asset attributes, and creating a plurality of sets of different synthetic dataset parameters; using computer graphics software, and example parameter values from among the synthetic dataset parameters, creating a synthetic dataset by compiling from a plurality of example images and metadata; configuring a plurality of machine learning trials and executing the trials to train a machine vision model, resulting in creating and storing a trained machine vision model; executing a validation of the trained machine vision model; and inferring a prediction using the trained machine vision model. Trained models are scored against success criteria and re-trained using pseudo-random sampling of different parameters clustered around failure points. As a result, machine vision models may be trained with high accuracy using large datasets of synthesized digital images that are richly parameterized, rather than human captured digital images.


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