The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Jun. 29, 2018
Applicant:

Toyota Research Institute, Inc., Los Altos, CA (US);

Inventor:

Paul J. Ozog, Ann Arbor, MI (US);

Assignee:

Toyota Research Institute, Inc., Los Altos, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/44 (2006.01); G06K 9/46 (2006.01); G06T 7/73 (2017.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/44 (2013.01); G06K 9/00798 (2013.01); G06K 9/4604 (2013.01); G06T 7/74 (2017.01); G06T 2207/30256 (2013.01);
Abstract

System, methods, and other embodiments described herein relate to improving an electronic representation of lines. In one embodiment, a method includes, in response to acquiring sensor data from at least one sensor representing a surrounding environment of a robotic device, extracting a feature representation of an observed line feature in the sensor data by providing a probability distribution that is defined based, at least in part, on feature parameters that overparameterize the observed line feature. The method includes converting the feature representation of the observed line feature into reduced parameters to avoid the feature parameters overparameterizing the observed line feature. The reduced parameters include an observation uncertainty for the line feature that is based, at least part, on the probability distribution. The method includes providing a detection distribution according to a correlation between the reduced parameters and a mapped line feature.


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