The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Jan. 22, 2019
Datalogic Ip Tech, S.r.l., Bologna, IT;
Federico Frontali, Imola, IT;
Enrico Campaioli, Bologna, IT;
Datalogic IP Tech, S.r.l., Bologna, IT;
Abstract
A generic shape quality verification process that allows the generalization of Association for Automatic Identification and Mobility (AIM) Direct Part Mark (DPM)/International Organization for Standardization (ISO)/International Engineering Consortium (IEC) (ISO/IEC) 29158 quality metrics for a generic shape marked or marked with a generic technique, wherein the AIM-DPM/ISO-IEC 29158 quality metrics, e.g., Cell Contrast, Cell Modulation, Grid Non Uniformity, Axial Non Uniformity, Fixed Pattern Damage, Unused Error Correction, and Print Growth are generalized to permit verification of a generic shape, are generalized to permit verification of a generic shape, where the process in accordance with the invention consists of the following three steps, i.e., (i) configuration, (ii) calibration and iii) work such that based on computed AIM-DPM/ISO-IEC 29158 metrics, it is possible to verify whether quality of the printed layout is acceptable.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile