The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Jun. 24, 2016
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Bolin Ding, Redmond, WA (US);

Silu Huang, Urbana, IL (US);

Chi Wang, Redmond, WA (US);

Kaushik Chakrabarti, Bellevue, WA (US);

Surajit Chaudhuri, Redmond, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2453 (2019.01); G06F 16/22 (2019.01); G06F 16/2455 (2019.01); G06F 16/2458 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2453 (2019.01); G06F 16/2228 (2019.01); G06F 16/2455 (2019.01); G06F 16/2462 (2019.01);
Abstract

A processing unit can determine a first subset of a data set including data records selected based on measure values thereof. The processing unit can determine an index mapping a predicate to data records associated with that predicate and approximation values of the records. The processing unit can process a query against the first subset to provide a first result and a first accuracy value, determine that the first accuracy value does not satisfy an accuracy criterion, and process the query against the index. In some examples, the processing unit can process the query against a second subset including data records satisfying a predetermined predicate. In some examples, the processing unit can receive data records and determine the first subset. Data records can include respective measure values. Data records with higher measure values can occur in the first subset more frequently than data records with lower measure values.


Find Patent Forward Citations

Loading…