The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

May. 22, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Danny Harnik, Tel Mond, IL;

Ronen I. Kat, Kokav-Yair, IL;

Ety Khaitzin, Holon, IL;

Sergey Marenkov, Tel Aviv, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/174 (2019.01); G06F 16/23 (2019.01); G06F 9/455 (2018.01); G06F 9/451 (2018.01);
U.S. Cl.
CPC ...
G06F 16/1752 (2019.01); G06F 9/452 (2018.02); G06F 9/45558 (2013.01); G06F 16/2365 (2019.01);
Abstract

A computer-implemented method includes receiving a set of basis fingerprints corresponding to image chunks within a basis set of image regions wherein each image region within the basis set of image regions comprises one or more image chunks, and generating a fingerprint for each image chunk of a plurality of selected image chunks within an unprocessed region of a machine image to produce a plurality of sampled fingerprints. The method also includes determining a similarity metric for the unprocessed region from the sampled fingerprints and the basis fingerprints, comparing the similarity metric for the unprocessed region with a selected threshold, and including the unprocessed region within the basis set of image regions in response to determining that the similarity metric is less than the selected threshold. A corresponding computer program product and computer system are also disclosed herein.


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