The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Aug. 20, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Salil Joshi, Bangalore, IN;

Hima Prasad Karanam, Bangalore, IN;

Manish Kesarwani, Bangalore, IN;

Sameep Mehta, New Delhi, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/34 (2006.01); G06N 7/00 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3461 (2013.01); G06N 7/005 (2013.01); G06N 20/00 (2019.01);
Abstract

Methods, systems, and computer program products for tracking missing data using provenance traces and data simulation are provided herein. A computer-implemented method includes generating, for each of multiple stages in a data curation sequence, a machine learning model of the data curation sequence, wherein the model is based on historical input records within the data curation sequence, historical output records within the data curation sequence, and provenance data within the data curation sequence; creating a simulated output record based on a detected anomaly corresponding to the data curation sequence; predicting the content of absent input records that precede the simulated output record in the data curation sequence and provenance data corresponding to the simulated output record; and outputting, to a user, in response to a query pertaining to the detected anomaly, the predicted input records and information relating the predicted input records to the detected anomaly.


Find Patent Forward Citations

Loading…