The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Sep. 24, 2018
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventor:

Xiaoheng Chen, Dublin, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/10 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 11/141 (2013.01); G06F 11/1435 (2013.01); G06F 11/1471 (2013.01);
Abstract

Exemplary methods and apparatus are provided for read recovery in solid state devices (SSDs) with non-volatile memories (NVMs). In some examples, a dynamic priority read retry table (PRT) is generated for use with a static read retry table (RRT). In one aspect, a most recent successful read retry entry is determined from among the entries in the RRT. The most recent successful read retry entry is inserted as a first priority read retry entry within the PRT. A subsequent read recovery operation is performed using the first priority read retry entry of the PRT. In some examples, one or more neighboring values are selected for each entry in the PRT starting with the newest entry and proceeding chronologically to the oldest entry. The use of the PRT may help address die-to-die variations, block-to-block variations, or the transient changes that may occur in device physics within NVMs.


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