The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Sep. 01, 2015
International Business Machines Corporation, Armonk, NY (US);
Jan Van Lunteren, Gattikon, CH;
James Coghlan, Wappingers Falls, NY (US);
Douglas J. Joseph, Leander, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for performing enhanced pattern scanning includes the steps of: providing a three-dimensional memory structure including multiple physical memory elements; compiling multiple programmable finite state machines, each of the programmable finite state machines representing at least one deterministic finite automation data structure, the data structure being distributed over at least a subset of the physical memory elements; configuring a subset of the programmable finite state machines to operate in parallel on a same input data stream, while each of the subset of programmable finite state machines processes a different pattern subset; and providing a local result processor, the local result processor transferring at least a part of a match state from the deterministic finite automation data structures to corresponding registers within the local result processor, the part of the match state being manipulated being based on instructions embedded within the deterministic finite automation data structures.