The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Jan. 30, 2018
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Bernd Georgi, Oberkochen, DE;
Martin Rummel, Aalen, DE;
Dominik Schmid, Aalen, DE;
Andreas Lotze, Dresden, DE;
CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH, Oberkochen, DE;
Abstract
A method is disclosed for correcting deviations in a production process of an article. Initially, measured 3D surface coordinates of a first article are obtained and used to create a virtual image of the first article that is displayed on a display apparatus that is fastened to the user's head. The virtual image is superimposed on a predefined model image of the article which is also displayed on the display apparatus to enable the user to detect any region(s) where the measured first article deviates from the predefined model. The user is then able, via a gesture (e.g., hand movement) or head movement, to select a particular region of deviation and control the desired corrective action to be performed on subsequently produced articles. The present method thereby enables the experienced user to subjectively select the region(s) requiring correction action and the degree and type of corrective action to be taken.