The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Nov. 20, 2018
Siemens Aktiengesellschaft, Munich, DE;
Thomas Bierweiler, Karlsruhe, DE;
Jean Pascal John, Karlsruhe, DE;
Daniel Labisch, Karlsruhe, DE;
Bernd-Markus Pfeiffer, Woerth, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method for automatically determining a parameterization of an evaluation method via a computer includes generating a comparison data set and storing reference data in the generated comparison data set, stipulating a parameterization with which identification of particular partial data items of reference data items stored in the comparison data set is influenceable via the evaluation method, such that a relative number of partial data items identified during the evaluation in relation to all the reference data items stored in the generated comparison data set is quantitatively smaller than a predetermined threshold value, preferably smaller than 10%, preferably smaller than 5%, particularly preferably smaller than 1%, and providing the determined parameterization for performing the evaluation method to identify particular partial data items of the data set of the industrial plant.