The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Jan. 19, 2015
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Vincent Reboud, Paris, FR;

Stefan Landis, Tullins, FR;

Etienne Rognin, Le Havre, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 35/00 (2006.01); G02B 27/00 (2006.01); B81C 1/00 (2006.01); B29C 35/02 (2006.01); B29C 59/02 (2006.01); B29D 11/00 (2006.01); G02B 3/00 (2006.01); G02B 3/02 (2006.01); G02B 3/08 (2006.01); B29K 25/00 (2006.01); B29K 33/00 (2006.01); B29L 11/00 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0012 (2013.01); B29C 35/002 (2013.01); B29C 35/02 (2013.01); B29C 59/02 (2013.01); B29D 11/00269 (2013.01); B29D 11/00365 (2013.01); B81C 1/00103 (2013.01); G02B 3/0018 (2013.01); G02B 3/02 (2013.01); G02B 3/08 (2013.01); B29K 2025/06 (2013.01); B29K 2033/12 (2013.01); B29L 2011/005 (2013.01); B81B 2201/047 (2013.01); B81B 2203/0392 (2013.01);
Abstract

A method for determining at least one reflow parameter for obtaining a structure approximating a sought structure by reflowing an initial structure different to the sought structure, the initial structure including at least one pattern formed in a thermo-deformable layer arranged on a substrate. The thermo-deformable layer forms a residual layer surrounding each pattern and from which each pattern extends such that each pattern has an interface only with the surrounding medium. The method includes: predicting progression over time of geometry of the initial structure subject to reflow, to obtain a plurality of predicted structures each associated with reflow parameters including at least a reflow time and a reflow temperature; computing correlation values of the geometry of each predicted structure with respect to the sought structure; identifying reflow parameters for obtaining the predicted structure offering a highest correlation value.


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