The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Nov. 10, 2017
Keyence Corporation, Osaka, JP;
KEYENCE CORPORATION, Osaka, JP;
Abstract
To provide an optical-scanning-height measuring device capable of efficiently measuring a shape of a desired portion of a measurement object. Designation of a measurement point on an image of a measurement object S is received. Light emitted from a light emitting sectionis deflected by the deflecting section and irradiated on the measurement object S. The deflecting section is controlled to irradiate the light on a portion of the measurement object S corresponding to the measurement point. A deflecting direction of the deflecting section or an irradiation position of the light deflected by the deflecting section is detected. Height of the portion of the measurement object S corresponding to the measurement point is calculated on the basis of the deflecting direction of the deflecting section or the irradiation position of the light deflected by the deflecting section and the light reception signal output by the light receiving section.